Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

AXFQ series portable directional X-Ray Flaw Detector with (glass X-Ray tube)

www.angstrom-advanced.com

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Introduction

The AXFQ series flaw detectors are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on. The glass x-ray tube allows to get images of excellent quality and clarity.

Types and Specification

Type	Output Voltage (kv)	Input Power (kw)	Focal Spot Size (mm2)	Divergent Angle	Max. Penetrate Depth in Steel (mm)	Generator Weight (kg)	Generator Size (mm3)
AXFQ-1005	50~100	1.2	0.8 × 0.8	40°	8	11.1	190 × 190 × 520
AXFQ-1605	60~160	1.5	0.8 × 0.8	40°	19	15.2	225 × 225 × 585
AXFQ-2005	100~200	2.0	1.5 × 1.5	40 ± 5°	30	23	285 × 285 × 665
AXFQ-2505	150~250	2.5	2.0 × 2.3	40 ± 5°	40	35	320 × 320 × 730
AXFQ-3005	170~300	3.0	2.3 × 2.3	40 ± 5°	50	45.5	345 × 345 × 830
AXFQ-3205	180~320	3.2	2.5 × 2.3	40 ± 5°	55	45.5	345 × 345 × 830
AXFQ-3505	180~350	3.4	2.8 × 3.0	40 ± 5°	60	47	345 × 345 × 800

Angstrom Advanced HGH3000/5000 Hydrogen Generator

Angstrom Advanced HGH3000/5000 Hydrogen Generator

www.angstrom-advanced.com

For more information please call Angstrom Advanced at:  781.519.4765

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Introduction

Angstrom Advanced would like to introduce its latest Model in Hydrogen Generation Technology: HGH5000 Hydrogen Generator. The HGH5000 has been designed to supply the highest purified hydrogen and it meets high levels of expectations in the demanding markets. The internal mechanisms that run this generator are integrated with the latest electrolytic cell technology, using stainless steel alloy as its hard body. The new ergonomic design and user-friendly interface have been modified for comfort and reliability for the consumer.

Features

• The HGH3000/5000 can be used to replace the conventional high-pressure steel tank.
• With an upgraded operating system, the generator has been modified to a simple plug and play operation to generate gas with a stable output flux.
• The components operating the HGH-type hydrogen generators, adopted the tube-design electrolytic cell specifications with multi-orifice distribution. This operation has been engineered to store liquid, produce hydrogen and emit hydrogen and oxygen respectively and simultaneously; without influencing the circulation of the electrolyte. The Plate-shaped electrolytic cell is an optimal substitute allowing a large mass-flow output of high purity gas with low temperatures in the large area.
• The HGH-Type generators are equipped with anti-back streaming operation, preventing liquid from flowing back and reducing the replacement of the silica gel; thus reducing manual support for a technician.
• We stand by HGH-Type generators with a guarantee assuring reliability and its purity levels of hydrogen.
• To operate and create hydrogen, HGH-Type generator must be supplied with Distilled Water; periodically determined by the user operations.
• Efficiency is a big priority at Angstrom Advanced; to improve electrolyzing efficiency, HGH-Type generators are equipped with energy saving output switching power supplies.

Type	HGH3000			HGH5000
Technical parameter	Purity	Working Pressure	Flux	Purity	Working Pressure	Flux
Name	(%)	(Mpa)	(ml/min)	(%)	(Mpa)	(ml/min)
Hydrogen	99.996	0-0.4	0-3000	99.996	0-0.4	0-5000
Voltage of Power Supply	VAC 220V±10%; 50HZ±5% VAC 110V±10%; 60HZ±5%
Environment Temperature	0-40℃ Relative Humidity ≤ 85%
Environment Condition	Without large quantity of dust and caustic gas
Maximum Power	1500W			2500W

Angstrom Advanced AA5000 Multi-function SPM Systems

Angstrom Advanced AA5000 Multi-function SPM Systems

For more information please call Angstrom Advanced at: 781.519.4765

www.angstrom-advanced.com

Request an Estimate

Introductions

Angstrom Advanced AA5000 Scanning Probe Microscope is our most innovated model. AA5000 features a full coverage of SPM techniques - STM, AFM, LFM; Conductive AFM, MFM, EFM; Environmental Control SPM and Nano-Processing. AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.

Features

Multi-function: AFM, LFM, STM; Conductive AFM, MFM and EFM; Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; SPM can be in liquid; Real-time temperature and humidity detecting; Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve; Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode; Fast automatically tip-engaging Simply change of the tip holder to switch between STM and AFM; Full digital control, auto system status recognition; Adjustable lightening inside With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved; Controller and Computer connected through a 10M/100M Fast Ethernet; Large sample size: up to diameter 45mm, 30mm thick; Online Control Software and offline Image Processing Software for Windows; Trace-Retrace scan, Back-Forward scan; Online real-time 3D image; Automatically Brightness and Contrast refresh; Data can be loaded out for further analysis; Nano-Movie function: Continuous data collection, storage and replay; Multi-Analysis: Granularity and Roughness; Tip Estimation and Image Re-construction; Modularized design for convenience of maintenance and future upgrade; Second display monitor and optical microscope system attachable;

Specifications

Functions Atomic Force Microscope (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; Lateral Force Microscope (LFM); Scanning Tunneling Microscope (STM); Conductive AFM, SPM in liquid, Environmental Control SPM; Nano-Processing System including Lithography Mode and Vector Scan Mode; Resolution AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical; Technical Parameters Current Sensitivity: less than or equal to 10pA; Force Sensitivity: less than or equal to 5pN; Image Pixels: 128x128, 256x256, 512x512, 1024x1024, 2048x2048; Scan Angle: 0-360 degree adjustable; Scan Rate: 0.1-100Hz adjustable; Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V; Temperature Sensitivity: 0.1 Celsius, Humidity Sensitivity: 0.5%RH; Sample Size: Up to 50mm x 50mm, 30mm thick; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm; Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x; Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; DAC: 20 channels of 16-bit DAC; ADC: 20 channels of 16-bit ADC; Communication Interface: 10M/100M Fast Ethernet;

Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope

Angstrom Advanced Inc. OS-AA Opening Multifunction Scanning Probe Microscope

Introduction

Angstrom Advanced OS-AA SPM system is known for its multi-functionality and full openness. OS-AA system is not just a platform for unconventional experiments but also for further developments.

Features

Multi-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase Imaging with Full digital control 16bit ADC/DAC High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange Input/output signal channel preserved for further system extension Standard external open interface for second developments I-V Curve and Force-Curve Nano-Processing Nano-manipulating with Super-Multimedia technology Designed for Windows Vista/XP/NT/2000/9X Hardcode and Dynamic Code both applied to offline software Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

Specifications

Resolution:	AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical
Current Sensitivity:	≤ 10pA
Force Sensitivity:	≤ 1nN
Positioning Accuracy:	≤ 0.5nm
Output channels preserved:	6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved:	16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved:	8ch DI, 8ch DO

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument
Introduction
Angstrom Advanced ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.
Features
	Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis, Crystallography, Texture analysis, Transmission, Thin film analysis. ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature.   ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable
Accessories
	AHTK 1000 high temperature attachment Automated variable temperature stage for X-ray diffraction measurements of materials at elevated temperatures (room temperature-1200°C). The stage may be operated in vacuum. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample.  ALTK-450 Variable temperature attachment Automated variable temperature stage for X-ray diffraction measurements of crystal structure (-193°C-450°C). The stage can be operated under liquid nitrogen cooling conditions..
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, mulriple plot, three-dimensional plot and simulation of XRD pattern. Qualitative Analysis: The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis: After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion) Plot and Export: The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted. Phase identification, structure analysis, Thin film analysis, stress investigation, Texture analysis are all available
Parts and Specifications
X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 4 kW Tube voltage 10-60 kV 1kV continuously adjustable Tube current 5-80 mA continuously adjustable X-ray tube Cu, Fe, Co, Cr, Mo et al (2 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2 Stability ≤ 0.0005%  mains fluctuation Goniometer Goniometer theta(θ)/theta(θ) Diffraction circle semi-diameter 285mm Scan range of θ -3° to +160° Continuous scanning speed 0.006-96°/min Setting speed of angle 1500°/min Scan mode θ-θ or θ, θ; Continuous or step scanning One way repeatability of θ ≤ 0.0002° precision of θd or θs ≤0.005° Minimal stepping angle 0.0001° Record Unit Counter PC or SC Maximal CPS 5x10^6 CPS Proportion counter energy spectrum resolution ≤ 25%(PC), ≤ 50%(SC) Detectable high voltage 1500-2100 continuous tune High voltage of  the counter  differential or integral, automatic PHA, dead time emendation ADX-DWZ System detector stability ≤ 0.01% Micro Structure Micro Structure analysis, +/-0.5nm Micro-Diffraction Micro sample or area, 2nm-19 um Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.5% Dimension 1000 × 800 × 1640 mm

Angstrom Advanced Hydrogen Generating Plant by Water Electrolysis

Angstrom Advanced Hydrogen Generating Plant by Water Electrolysis Call Angstrom Advanced for more Information: 781.519.4765 View Technical Knowledgebase Request an Estimate

Introduction

In this state-of-the-art setup by Angstrom Advanced, hydrogen electrolytes and oxygen electrolytes circulate separately, hydrogen electrolyte pumps into hydrogen cell directly and oxygen electrolyte pumps into oxygen cell directly, and therefore results in higher purity of hydrogen and oxygen gas.

Specifications

H2 capacity	2-500 Nm3/h
O2 capacity	1-250 Nm3/h
H2 purity %	>99.9
O2 purity %	>99.5
Power consumption (DC)	< 4.5 kw.h/m3H2
Electrolyte	30% KOH
Work pressure	0.5-5.0MPa

Electrolysis Process Overview
Electrolysis is the passage of a direct electric current through an ionic substance that is either molten or dissolved in a suitable solvent, resulting in chemical reactions at the electrodes and separation of materials.

The main components required to achieve electrolysis are:

An electrolyte:	A substance containing free ions which are the carriers of electric current in the electrolyte. If the ions are not mobile, as in a solid salt, then electrolysis cannot occur.
A direct current (DC) supply:	provides the energy necessary to create or discharge the ions in the electrolyte. Electric current is carried by electrons in the external circuit.
Two electrodes:	an electrical conductor which provides the physical interface between the electrical circuit providing the energy and the electrolyte. Electrodes of metal, graphite and semiconductor material are widely used. Choice of suitable electrode depends on chemical reactivity between the electrode and electrolyte and the cost of manufacture.

Angstrom Advanced Hydrogen Generating Plant by Methanol Decomposition

Angstrom Advanced Hydrogen Generating Plant by Methanol Call Angstrom Advanced for more Information: 781.519.4765 View Technical Knowledgebase Request an Estimate

Introduction

Angstrom Advanced Hydrogen generation by methanol decomposition was developed in the last two decades. This technology features low cost, simple user friendly operation and very easy maintenance.

Specifications

H2 capacity	5-3000 Nm3/h
H2 purity %	99-99.9995%
Work pressure	>99.9

Angstrom Advanced Hydrogen Plant by Methanol Features
Methanol is converted to CO and H₂ with the action of the catalyst. CO and H₂O are converted to CO₂ and H₂ with the action of the catalyst. CO₂ and trace CO are separated from the decomposed gases by PSA technology, and high purity of H₂ is generated.

Angstrom Advanced Knowledge base: Hydrogen Generating Plant

Angstrom Advanced Hydrogen Generating Plant by Water Electrolysis

Oxygen and electrolytes from the anode side are pumped into an oxygen separator, where oxygen separates with electrolytes under the effects of gravity, then oxygen passes through an oxygen cooler. There, the oxygen is cooled to a temperature of 30~425℃, where it then passes through an oxygen demister to remove liquid water from gas. The pressure of the system is raised to and maintained at a set value by means of a pressure regulation valve. The electrolytes at the bottom of the oxygen separator are pumped back to the oxygen cell of the electrolyser. After filtering and cooling, oxygen side circulation is finished.

According to the capacity and work pressure of a hydrogen generator, the handling capacity of its hydrogen purifier is determined. In order to guarantee the quality of hydrogen after purification, we use purified hydrogen as regeneration gas.

The total system includes a hydrogen generator, hydrogen purifier, electrical and control unit as well as a hydrogen buffer tank and a storage container. In this unit, water is decomposed into hydrogen and oxygen through electrolysis, for which the equation is 2H₂O==2H₂+O₂. There is a hydrogen buffer tank between the hydrogen generator and hydrogen purification equipment; it is used to remove dissociative water from hydrogen and to keep the pressure of the hydrogen purification unit stable. Hydrogen flows into the purifier though this buffer. The purpose of purification equipment is to purify the generated hydrogen. The oxygen is removed through a chemical reaction under catalytic effects, and water is removed by way of adsorption.

The hydrogen from water electrolysis has the advantages of high purity and simple composition, and normally only has impurities such as oxygen and water. It is easy to purify the hydrogen to much higher purity levels for use in the electronic industry.

Angstrom Advanced Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

STM relies on “tunneling current” between the probe and the sample to sense the topography of the sample. The STM probe, a sharp metal tip (in the best case, atomically sharp), is positioned a few atomic diameters above a conducting sample which is electrically biased with respect to the tip. At a distance under 1 nanometer, a tunneling current will flow from sample to tip. In operation, the bias voltages typically range from 10 to 1000 mV while the tunneling currents vary from 0.1 to10 nA. The tunneling current changes exponentially with the tip-sample separation, typically decreasing by a factor of two as the separation is increased 0.2 nm. The exponential relationship between the tip separation and the tunneling current makes the tunneling current an excellent parameter for sensing the tip-to-sample separation. In essence, a reproduction of the sample surface is produced by scanning the tip over the sample surface and sensing the tunneling current. STM relies on a precise scanning technique to produce very high-resolution, three-dimensional images of sample surfaces. The STM scans the sample surface beneath the tip in a raster pattern while sensing and outputting the tunneling current to the SPM Controller. The digital signal processor (DSP) in the Controller controls the Z position of the Piezo Scanner based on the tunneling current error signal. The STM operates in both “constant height” and “constant current” data modes, depending on the Feedback Gain settings. The DSP always adjusts the height of the tip based on the tunneling current error signal, but if the feedback gains are set extremely low (e.g., Integral Gain < 15 and Proportional Gain < 15), the piezo remains at a nearly constant height while tunneling current data is collected. With the Feedback Gains high (e.g., Integral Gain >15 and Proportional Gain >15), the Scanners Piezo height changes to keep the tunneling current nearly constant, and changes in piezo height are used to construct the image. The exponential relationship between tip-sample separation and tunneling current allows the tip height to be controlled very precisely.

Angstrom Advaned Atomic Force Microscope and Scanning Force Microscope Software

Angstrom Advaned Atomic Force Microscope and Scanning Force Microscope Software

The Software is available with the following data types of images

AFM Contact Mode:       Topography — the rise and fall of the sample surface.       Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can       be reflected by the Photodectetor’s Up-Down signal.       Friction - lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal.

AFM Tapping Mode:       Topography — the rise and fall of the sample surface.       Amplitude — cantilever oscillating amplitude changes because of the rise and fall of sample topography.       Phase — cantilever oscillating phase changes because of the sample material characteristics.

Scanning Tunneling Microscope:       Topography —the rise and fall of the sample surface.       Current — Tunneling current changes between tip and sample surface.

Angstrom Advanced Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

The SPM Controller in Angstrom Advanced atomic force microscopes handles all SPM electronics such as signal processing and feedback programming. The Controller inputs commands from a control computer via 60 pin cable and outputs the control signals that are needed for operating an AFM stage. Additional signals from the stage are relayed through the SPM Controller via the Network cable to the control computer. At the rear of the Controller, in addition to the Network cable connection, there are two input/output ribbon cables. A 60-pin cable is used to send and receive signals from the microscope stage. A second 50-pin cable is used for accessing all of SPM Controllers signals for testing or experimentation.

Angstrom Advanced Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Base of Atomic Force Microscope and Scanning Force Microscope

The base of Atomic Force Microscope holds the detector, AFM Head.It also has environmental control attachment along with other optional attachments such as Vibration Isolation System.

AFM

Angstrom Advanced Renewable Power Generating System Introduction

  Because of its unique design in the electric system and controlling capability, Angstrom Advanced Renewable Power Generating System can adapt 100% fluctuating power from wind turbines/solar panels, and realize 100% utilization of renewable power during the hydrogen production.

    Currently, this patented technology can be applied in 2NM3 – 1000NM3/Hour hydrogen generating systems, and therefore Angstrom Advanced Inc. could provide a variety of renewable energy generating systems, customized for different clients. This technology represents a bright future of massive production and utilization of hydrogen in the 21st century.

Angstrom Advanced Atomic Force Microscope and Scanning Force Microscope Head

AFM Head holds the following components:	XY Translation Stage: Holds probe head, movable in XY direction by XY translation screws and in Z direction by controls in software
Position Sensitive Photo detector (PSPD):	Detects laser deflections, which is then converted into a topographical map
PSPD adjustment screws:	Controls position of PSPD; screw on left controls up and down adjustment; screw on right controls left right adjustment
Laser Beam Steering Screws:	Controls position of laser on back of cantilever

Angstrom Advanced Atomic Force Microscope and Scanning Force Microscope Probes

Different kinds of probes can be used in an Atomic Force Microscope. Proper probe selection depends on sample characteristics and system conditions.

Metal Probes:	Probe used in STM must be conductive and a atomic-sharp tip is required. STM tips can be obtain by simply cut (for Pt-Ir) and electronically eroded (for tungsten).
Cantilever Probes:	A flexible cantilever with an atomic-sharp tip is widely used in AFM as below. Most cantilever probes are made by Si or SiN with different types of coatings and different shape and size. Different samples and system conditions required different cantilevers.

Contact Mode:	Theoretically all kinds of cantilever probes can be used in contact mode. But because of the different force constant parameters, harder cantilever will cause the sample damages with the same amount of deflection.
Tapping Mode:	An oscillating cantilever is required in Tapping mode. So theoretically using cantilevers with higher resonance frequency will give better resolution. Cantilevers with larger force constant and higher resonance frequency (normally over 200kHz) should be chosen.

Angstrom Advanced Scanning Tunneling Mode

STM relies on “tunneling current” between the probe and the sample to sense the topography of the sample. The STM probe, a sharp metal tip (in the best case, atomically sharp), is positioned a few atomic diameters above a conducting sample which is electrically biased with respect to the tip. At a distance under 1 nanometer, a tunneling current will flow from sample to tip. In operation, the bias voltages typically range from 10 to 1000 mV while the tunneling currents vary from 0.1 to10 nA.

The tunneling current changes exponentially with the tip-sample separation, typically decreasing by a factor of two as the separation is increased 0.2 nm. The exponential relationship between the tip separation and the tunneling current makes the tunneling current an excellent parameter for sensing the tip-to-sample separation. In essence, a reproduction of the sample surface is produced by scanning the tip over the sample surface and sensing the tunneling current.

STM relies on a precise scanning technique to produce very high-resolution, three-dimensional images of sample surfaces. The STM scans the sample surface beneath the tip in a raster pattern while sensing and outputting the tunneling current to the SPM Controller. The digital signal processor (DSP) in the Controller controls the Z position of the Piezo Scanner based on the tunneling current error signal. The STM operates in both “constant height” and “constant current” data modes, depending on the Feedback Gain settings. The DSP always adjusts the height of the tip based on the tunneling current error signal, but if the feedback gains are set extremely low (e.g., Integral Gain < 15 and Proportional Gain < 15), the piezo remains at a nearly constant height while tunneling current data is collected. With the Feedback Gains high (e.g., Integral Gain >15 and Proportional Gain >15), the Scanners Piezo height changes to keep the tunneling current nearly constant, and changes in piezo height are used to construct the image. The exponential relationship between tip-sample separation and tunneling current allows the tip height to be controlled very precisely.

Angstrom Advanced Portable Hydrogen Generator by Water Electrolysis

Angstrom Advanced Portable Hydrogen Generator by Water Electrolysis

For more information please call Angstrom Advanced at: 781.519.4765

Request an Estimate

Introduction:

The hydrogen electrolyte and oxygen electrolyte circulate separately. Both electrolytes pump into their respective, separate cells directly, allowing for the collection of higher purity hydrogen and oxygen.

Specifications
H2 capacity	0.18-30 Nm3/h
O2 capacity	0.09-15 Nm3/h
H2 purity %	>99.9
O2 purity %	>99.5
Power consumption (DC)	< 4.5 kw.h/m3H2
Electrolyte	Pressurized
Work pressure	0.5-3.0MPa