Angstrom Advanced AFM/SEM/SPM Options

Angstrom Advanced Inc. designs, manufactures and supplies a wide range of scientific instruments as well as Hydrogen & Nitrogen plants for industrial and academic fields. Angstrom Advanced scientific instruments and plants have been delivered to many renowned organizations around the world.

Probes: 1) Platinum-Iridium Probes for STM: Pt: 80%, Ir: 20%, Diameter: 0.25mm 2) Tungsten Probes for STM
Calibration Standards: 1) 1-D Standards 2) 2-D Standards 3) Step Height Standards 4) Tip Characterizer Standards
Scanners
Optical Microscope System by Angstrom Advanced
Vibration Isolation System 1) Size: 460 X 400 X 1060mm 2) Frequency: <0.55Hz vertical, <0.60Hz
Tip Holders: 1) STM Tip Holder 2) AFM/LFM Tip Holder 3) Tip Holders for other developments

An Angstrom Introduction to Atomic Force Microscopy

I don’t need an introduction, just take me to your list of microscope products!

Atomic Force Microscopy is an advanced form of scanning probe microscopy capable of viewing and manipulating particles in a sample down to an atomic scale. The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is a silicon or silicon nitride arm with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke’s law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces,Casimir forces, solvation forces, etc.

Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe. Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive sensing or piezoresistive AFM cantilevers. These cantilevers are fabricated with piezoresistive elements that act as a strain gauge. Using a Wheatstone bridge, strain in the AFM cantilever due to deflection can be measured, but this method is not as sensitive as laser deflection or interferometry. The technology used in atomic force microscopy allows the devices to demonstrate resolutions up to 1000 times larger than the optical diffraction limit of a regular optical microscope.

Angstrom Advanced Atomic Force Microscopes: Modes

a> a> s

Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle

Non-Contact AFM Non-Contact AFM oscillates the cantilever at a constant frequency with an amplitude around 10 nm. The height of the surface can be found by measuring the output of the control loop which keeps the frequency constant. Non-contact Atomic Force Microscopes scan much quicker than contact microscopes because the tip does not fatigue. Non-contact AFM is also useful for measuring flexible samples. Contact AFM can scratch and alter the surface of softer samples. The contact method can penetrate through liquids while non-contact will read surface liquids as the sample surface.
Tapping Method Tapping Atomic Force Microscopes have large oscillations in the tip (100 to 200 nm) which are damped by Van der Waals and dipole forces from the surface of the sample. This method is more gentle than the traditional contact method. The tapping method can also measure through liquid surfaces when used properly.
Conductive AFM Option (C-AFM) CAFM measures both the surface topography and the conductivity of a samples. Voltage is applied to the tip and the current through the tip and sample is measured. It is used for semiconducting, low and medium conducting materials.
Contact Mode The tip is always in contact with the sample surface in contact AFM. The deflection of the tip is measured and held constant by a feedback loop. The stiffness of the cantilever must be low enough to prevent the tip from altering the surface of the sample.
Scanning Tunneling Microscope Angstrom Advanced Scanning Tunneling Microscopes (STM) have a tip which is actuated in the vertical direction by a piezoelectric crystal. The readings from a scanning tunneling microscope are limited by the sharpness of the tip. STM is a different method of getting very similar results to AFM. It maintains a constant distance from the sample through a feedback controller to measure the surface of the sample.

Software Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x

Angstrom Advanced ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument

Angstrom ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a table top multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nano materials and many other different materials. The ADX8000 can be used for many different applications – Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Meteorology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

Our instruments and plants have been delivered to many renowned organizations.

Rated output power 600W, 1200WX-ray Generator Control mode 1kV/step, 1mA/step controlled by PC
Technique ParametersADX–8000–ray X Mini Powder θ–θ instrumento de difracción es una mesa difractómetro multifunción con velocidad de análisis excepcional, fiabilidad y reproducibilidad. El ADX8000 ha sido diseñado exclusivamente para los retos de la investigación de materiales modernos, donde el tiempo de vida de un difractómetro es considerablemente más largo que el horizonte de cualquierproyecto de investigación. Los componentes son parte superior de la línea y establecen un sistema de gran alcance. El ADX8000 tienecapacidad para polvos, líquido, película delgada, materiales nano y muchos otros materiales diferentes. El ADX8000 se puede utilizarpara muchas aplicaciones diferentes – Académico, Farmacia, Química y Petroquímica, la investigación de materiales, Thin FilmMeteorología, tecnología Nano, Alimentación y Cosmética, Medicina Forense, Minería y Minerales, Metales, plásticos y polímeros, etc

Tube voltage 40 kV continuously adjustable
Tube current 13-30mA continuously adjustable
X-ray tube Cu (2.4KW)
Focus dimension: 1×10 mm2
LFF Ceramic or Glass
Stability ≤ 0.001% mains fluctuation
Goniometer Goniometer θ – θ
Diffraction circle semi-diameter 150mm
Scan range of θ -3° to +150°
Continuous scanning speed 0.0012°/min to 70°/min
Setting speed of angle 1500°/min
Scan mode θ-θ or θ, θ; Continuous or step scanning
One way repeatability of θ ≤ 0.0001°
precision of θd or θs ≤0.0001°
Minimal stepping angle 0.0001°
Filter Ni
Slits Divergence slit, Scattering slit, receiving slit

Record Unit Counter Point Counter or Scintillating Counter
Maximal CPS 5×105 CPS, 5x107CPS
Proportion counter energy spectrum resolution ≤ 25%(Cu, Ka)
Detectable high voltage 1500-2100 continuous tune
High voltage of the counter differential or integral, automatic PHA, dead time emendation
System detector stability ≤ 0.01%
Sample stage Z Adjustable
Integrated performance Dispersion dosage ≤ 1μSv/h
Integrated stability of the system ≤ 0.5%
ADX-DWZ Micro Structure Micro Structure analysis, +/-0.5nm
MicroDiffraction Micro sample or area, 2nm-19 um
Instrument Dimensions 24X16X26In

Data Processing Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al.
Qualitative Analysis
The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
Quantitative Analysis
After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion)
Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available
c instruments and Hydrogen & Nitrogen plants for academic and industrial fields Angstrom Advanced goal is to provide our customers with the best products with highest standard of service at cost efficient pricing.

Our instruments and plants have been delivered to many renowned organizations.

Angstrom Advanced Inc offers a wide variety of Renewable Energy product line

Angstrom Advanced Inc offers a wide variety of Renewable Energy product line ranging from wind turbines, fuel cells and solar panels up to renewable hydrogen generation system with state of the art technology that is first on the market. With our advanced technology our system is the first system worldwide that is capable to fully adapt intermittent renewable power into hydrogen production process. Those gas generators can use the unstable electrical energy transformed from wind power or solar power.

The official website of Angstrom Advanced In is followedhttp://www.angstrom-advanced.com/
WIND POWER
Wind power is produced by using wind generators to harness the kinetic energy of wind. It is gaining worldwide popularity as a large scale energy source, although it still only provides less than one percent of global energy consumption. The articles listed below explore wind power and its usage around the world.
http://www.alternative-energy-news.info/technol…/wind-power/

Atomic Force Microscope & Scanning Probe Microscope Probes

Atomic Force Microscope & Scanning Probe Microscope Probes
Different kinds of probes can be used in an Atomic Force Microscope. Proper probe selection depends on sample characteristics and system conditions.
Metal Probes
Probe used in STM must be conductive and a atomic-sharp tip is required. STM tips can be obtain by simply cut (for Pt-Ir) and electronically eroded (for tungsten).

Cantilever Probes
A flexible cantilever with an atomic-sharp tip is widely used in AFM as below.

Most cantilever probes are made by Si or SiN with different types of coatings and different shape and size.
Different samples and system conditions required different cantilevers.

Contact Mode: Theoretically all kinds of cantilever probes can be used in contact mode. But because of the different Force constant parameters, harder cantilever will cause the sample damages with the same amount of deflection.

Tapping Mode: A oscillating cantilever is required in Tapping mode. So theoretically using cantilevers with higher resonance frequency will give better resolution. Cantilevers with larger force constant and higher resonance frequency (normally over 200kHz) should be chosen.

For more information please call Angstrom Advanced at: 781.519.4765

Atomic Force Microscopes & Scanning Probe Microscopes Tip holders

AFM Tipholder: 1. Tip holder Handle 2. Spring Clip which secure the cantilever 3. Cantilever notch STM Tipholder: 1. Tip holder Handle 2. Installation tube for Pt-Ir or tungsten tips

 For more information, please call Angstrom Advanced at: 781.519.4765 or see http://www.angstrom-advanced.com/ 

Aotomic Force Microscope & Scanning Probe Microscope Software

The Software is available with the following data types of images AFM Contact Mode: Topography — the rise and fall of the sample surface. Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can be reflected by the Photodectetor’s Up-Down signal. Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal. AFM Tapping Mode: Topography — he rise and fall of the sample surface. Amplitude — antilever oscillating amplitude changes because of the rise and fall of sample topography. Phase — cantilever oscillating phase changes because of the sample material characteristics. Scanning Tunneling Microscope: Topography — the rise and fall of the sample surface. Current — Tunneling current changes between tip and sample surface.

Atomic Force Microscope & Scanning Probe Microscope Head

AFM Head holds the following components:
XY Translation Stage: Holds probe head, movable in XY direction by XY translation screws and in Z direction by controls in software
Position Sensitive Photo detector (PSPD): Detects laser deflections, which is then converted into a topographical map
PSPD adjustment screws: controls position of PSPD; screw on left controls up and down adjustment; screw on right controls left right adjustment
Laser Beam Steering Screws: controls position of laser on back of cantilever

Atomic Force Microscope & Scanning Force Microscope Controller

The SPM Controller handles all SPM electronics such as signal processing and feedback programming. The Controller inputs commands from a control computer via 60 pin cable and outputs the control signals that are needed for operating an AFM stage. Additional signals from the stage are relayed through the SPM Controller via the Network cable to the control computer. At the rear of the Controller, in addition to the Network cable connection, there are two input/output ribbon cables. A 60-pin cable is used to send and receive signals from the microscope stage. A second 50-pin cable is used for accessing all of SPM Controllers signals for testing or experimentation.

Angstrom Advanced Scanning Probe Microscopy (SPM)

       Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981. Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode. The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. They owe this largely to the ability of piezoelectric actuators to execute motions with a precision and accuracy at the atomic level or better on electronic command. One could rightly call this family of techniques “piezoelectric techniques”. The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.


                                                                       AA3000 Scanning Probe Microscope

Introduction
AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance

• Atomic-scale of resolution
• Large sample size
• DSP (Digital Signal Processor)- for great performance
• Real time operating system embedded
• Fast Ethernet connection with computer

Multi-Function

• Atomic Force Microscope (AFM)
• Scanning Tunneling Microscope (STM)
• Lateral Force Microscope (LFM)
• Force Analysis: I-V Curve, I-Z Curve, Force Curve
• Online real-time 3D image for better observation
• Multi-channel signals for more sample details
• Trace-Retrace scan, Back-Forward scan
• Multi-Analysis: Granularity and Roughness
• Data load-out for further analysis

Easy Operation

• Fast automatically tip-engaging
• Simple change of the tip holder to switch between STM and AFM
• Full digital control, auto system status recognition
• Software-based sample movement
• Nano-Movie function: Continuous data collection, storage and replay
• Modularized design for convenient maintenance and future upgrades

For more information http://www.angstrom-advanced.com/?page=Y3000

Introduction to: Atomic Force Microscope & Scanning Probe Microscope

The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is a silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke’s law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces, Casimir forces, solvation forces, etc. Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe. Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive sensing or piezoresistive AFM cantilevers. These cantilevers are fabricated with piezoresistive elements that act as a strain gauge. Using a Wheatstone bridge, strain in the AFM cantilever due to deflection can be measured, but this method is not as sensitive as laser deflection or interferometry.

Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm).If the tip was scanned at a constant height, a risk would exist that the tip collides with the surface, causing damage. The feedback mechanism is employed to adjust the tip-to-sample distance to maintain a constant force between the tip and the sample. The sample is mounted on a piezoelectric tube, that can move the sample in the z direction for maintaining a constant force, and the x and y directions for scanning the sample. The tip is mounted on a piezo scanner while the sample is being scanned in X and Y using another piezo block. The resulting map of the area z = f(x,y) represents the topography of the sample. The AFM can be operated in a number of modes, depending on the application. In general, possible imaging modes are divided into contact modes and a non-contact modes where the cantilever is vibrated.

Angstrom Advanced Liquid Nitrogen/Oxygen/Argon Plant by Cryogenic Technology

Liquid Nitroge/Oxygen/Argon Plant by Cryogenic Technology

www.angstromadvancedinc.com

For more information please call Angstrom Advanced at: 781.519.4765

Request an Estimate

Liquid Nitrogen/Oxygen/Argon Plants by Cryogenic Technology are top of the line systems. Our generator applications cover a range of production rates depending on the settings employed: Oxygen: 5~10,000L/H, Nitroge: 5~10,000L/H, and Argon: 1~500L/H. The Cryogenic Engine features Fully Automatic G-M cold head with integral contrlos. It also includes high efficiency frequency drive with water cooling or optional air cooling. Fully automatic programmable logic controls (PLC) provide many features and modes including auto start, timed run, auto purge, etc. At the time of the order, an Optional Chiller can be attached to liquefier unit to allow continuous operation up to 45°C. The output purity of each gas generated from the plant are as follows: Nitrogen-99.9999% Oxygen -99.95% Argon- 99.9999%.

Specifications
Capasity	5-10,000L/H
Purity	>99%
Input Air Pressure	0-2MPa
Working Pressure	0-2MPa
Temperature	-195°C
Power Supply	AC 220V/50Hz, 110V/60Hz

Angstrom Advanced Nitrogen/Oxygen Generating Plant by Membrane Separation

Nitrogen/Oxygen Generating Plant by Membrane Separation www.angstromadvancedinc.com For more information please call Angstrom Advanced at: 781.519.4765 Request an Estimate

In this setup, compressed air is pumped through a compressor filter, along with polymer membrane filters. Due to variable solubility and proliferation factors, different gasses in the air penetrate the membrane at different rates, allowing for their separation. Based on their diffusion rates, the gasses in the air are then placed into one of two categories: “rapid gas” or “slow gas.” After being compacted and purified (to remove oil, water, and dust), the air will be passed through the membrane in order to create a separation of the gasses. The “rapid gasses,” oxygen, carbon dioxide, and some vapors, will be the first to infiltrate the membrane wall, and exit through a discharge port via air pressure. Because nitrogen is characterized as a “slow gas,” it will flow from the gas collector at the end of the pressure box, and finally enter a buffer tank where it will be stored.

Specifications
Nitrogen Production	1-1000NM3/H
Nitrogen Purity	>95-99.9%
Dew Point	≤-40°C
Work Pressure	0-2.0 Mpa

Angstrom Advanced Hydrogen Generating Plant by Natural Gas Reforming

Hydrogen Generating Plant by Natural Gas Reforming

www.angstromadvancedinc.com

For more information please call Angstrom Advanced at: 781.519.4765

Request an Estimate

Prior to pressurization, desulfurization, and mixing with aqueous vapor, natural gas is passed through a special reformer which is packed with a catalyst for cracking and reforming the effluent mixture of hydrogen, carbon dioxide and carbon monoxide. After part of the heat is recovered, hydrogen will be obtained by removing excess carbon monoxide from the reformed effluent. The shift gas is then purified further through pressure swing adsorption (PSA), to obtain pure hydrogen.

Specifications
Gas Treatment	50-20000 Nm3/h
Adsorption Pressure	1.3MPA-2.0MPA
H2 purity %	99-99.999%

Angstrom Advanced Hydrogen Generating Plant by Ammonia Decomposition

Hydrogen Generating Plant by Ammonia Decomposition

www.angstromadvancedinc.com

For more information please call Angstrom Advanced at: 781.519.4765

Request an Estimate

 

 

The Hydrogen Generating Plant by Ammonia Decomposition offers a variety of benefits. The system is low cost, has a long service life, simple operation, compact structure, small coverage, and simple installation. The system vaporizes liquid ammonia, and heats it with a catalyst until decomposition occurs, creating a mixture of gas consisting of 75% hydrogen and 25% nitrogen. Based on the principle that the molecular sieve adsorbs ammonia and water at different temperatures, high purity gas is produced by heat regenerating through the mixture working at normal temperature.

Specifications
Hydrogen Production	5-500NM3/H
Impurity Oxygen	≤2ppm
Residual Ammonia	≤3ppm
Dew Point	≤-65°C
Dew Point	0.05-0.2Mpa

Angstrom Advanced Nitrogen/Oxygen Generating Plant by Pressure Swing Adsorption

Nitrogen/Oxygen Generating Plant by Pressure Swing Adsorption

Introduction

Angstrom Advanced oxygen and nitrogen generation system uses pressure swing adsorption principles at normal temperatures, along with clean, compressed air as the raw material, and a carbon molecular sieve as the adsorbent. Due to different adsorption of oxygen and nitrogen onto the carbon molecular sieve surface as well as different diffusion rates through the open or closed program control valve, separation of the two gasses is achieved, and nitrogen of required purity is produced.

Specifications

Nitrogen Production	1-2000NM3/H
Nitrogen Purity	>95-99.999%
Oxygen Production	10-500 NM3/H
Oxygen Purity	>99.9%
Dew Point	≤-40°C
Working Pressure	0-2.0 Mpa

Angstrom Advanced Hydrogen Generating Plant by Methanol

Angstrom Advanced Hydrogen Generating Plant by Methanol

www.angstromadvancedinc.com

For more information please call Angstrom Advanced at: 781.519.4765

Request an Estimate

Hydrogen generation by methanol decomposition was developed in the last two decades. This technology features low cost, simple user friendly operation and very easy maintenance ·         – Methanol is converted to CO and H2 with the action of the catalyst; ·         – CO and H2O are converted to CO2 and H2 with the action of the catalyst; ·         – CO2 and trace CO are separated from the decomposed gases by PSA technology, and high purity of H2 is generated.

Specifications
Hydrogen output	50~3000m3/h
Pressure	0.8-2.0 MPa
Purity %	99.9%-99.9995%

Angstrom Advanced ABT-2001 Laser Particle Size Analyzer

Introduction

Angstrom Advanced ABT-2001 Laser Particle Size Analyzer is a high-performance particle size analysis system incorporating modes for measuring both dry and liquid samples. This unit features easy operation, fast testing speeds, high accuracy and excellent repeatability. ABT-2001 is widely applicable for particle size analysis in production industries such as cement plants, pharmaceutical manufacturing, magnetic materials, as well as laboratories in universities and research institutes.

Features

1. Data processing through full-course Mie scattering theory leads to high accuracy resolution and repeatability
2. Serial port for transmitting data, which can be easily connected with all PC and Laptops
3. Standard Windows desktop with a user-friendly interface, easy to operate. Functionality includes serial tests, averaged results, results preview, print, save, query, compare, unite, edit, delete, modify, help and self-diagnosing, etc

Specifications

Size Range	Dry 0.29μm – 275μm Liquid 0.1μm – 340μm
Sample Feed Mode	Dry: Electric vibration Liquid: circulating pump
Repeatability	Dry: less than 3%(on standard sample SB 2005 D50) Liquid: less than 5%( on standard sample SB 2005 D50)
TestTime	2-3 min/time normally (dispersing time included)
Test Report	Cumulative particle size distribution (data + curve), differential particle size distribution (data + histogram), median (D50), weight average particle size, specific surface area, etc.
Data Transmission Mode	RS232
Operating System	Windows,ME, 2000, and XP
Printer	Stylus, jetting , laser

Angstrom Advanced ABT-2003 Laser Particle Size Analyzer

Angstrom Advanced ABT-2003 Laser Particle Size Analyzer

Introduction

Particle sizing is a critical production process. Particle size distribution is significant for quality control, quality assurance and performance testing. Examples of this can include: catalyst on catalytic result; cement curing time and ultimate strength; mineral composition and quality and performance; for coating effect and surface luster for painting applications; for determining medicinal taste, absorption rate and curative effect, etc. Therefore effective particle size distribution control in powder processing is the top priority for quality assurance, public health and safety, reduction of energy consumption and control of product waste. Effective control on particle size distribution in powder processing and application is important for quality improvement, protection of public health, reduction of energy consumption and control of environment pollution.
ABT-2003 laser particle size analyzer (LPSA) is a new model particle size analyzer working on the basis of laser scattering theory. It includes analyzer itself, sample preparation device and computer system, etc. Sample is carried to the testing zone in analyzer by sample preparation device, after laser illumination, scattered light signals are detected and transformed into an electric signal. This signal is then transmitted to the computer by USB or RS232 to be processed by special particle size test software on the basis of Mie theory to obtain results of particle size distribution.

Features

• Advanced manufacturing techniques makes the instrument compact, great in appearance and convenient for use and maintenance. Effective anti-interference technology improves electrical stability and reduces fault rate.
• Two sample feeding modes: small cell and automatic circulating & dispersing system (ACDS). Selectable by the user with easy replacement.
• Mie scattering and Fraunhoffer diffraction theories are applied in data processing. Both include R-R distribution and random distribution for selection.
• Interior computer-controlled self-alignment system performs automatic lens focus to improve accuracy; Exterior ACDS makes sample preparation more convenient.
• Specially designed light receiver array with 76 detectors, greatly improves resolution. User-friendly interface of the test software makes operation easy; including saving of results, locating details, comparison, merging, editing, deleting, help, etc.
• Six report forms in English including cumulative particle size distribution data and graph, frequency particle size distribution data, histogram and typical particle diameter range such as D3, D10, D25, D50, D75, D84, D90, D97, D98, etc. Layout, color, and font of the report are editable.

Applications

1. Non-metallic powders such as calcium carbonate, talcum powder, kaolin, zirconium silicate, wollastonite, graphite, silica powder, tourmaline, mica, barite, plaster, bentonite, diamond, quartz, diatomite, feldspar, calamite, clay, garnet, vermiculite, Titanium white power, etc.
2. Metallic powders, such as aluminum powder, iron powder, magnesium powder, molybdenum powder, copper powder, zinc powder, other rare metal power and varied alloy powder, etc
3. Pharmaceutical, agricultural pesticide, grinding particle, foodstuff, scientific research, teaching, cement, ceramic, glass, chemical industry, military industry, soil, pigment, oil exploration, geological analysis, river silt and electronic particle, etc.

Specifications

Size Range	0.04 – 600μm
Sample feeding mode	Flow cell
Repeatability	≤1%(for standard sample D50)
Test Time	1-3 min/test
Test Report	Cumulative particle size distribution (data + curve), differential particle size distribution (data+ histogram, median (D50), weight average particle size, specific surface area, ect.
Data Transmission	USB or RS232
Computer & system	Windows ME, 2000, and XP
Printer	Stylus printer, ink, and laser

Angstrom Advanced ABT-9300S Laser Particle Size Analyzer

Angstrom Advanced ABT-9300S Laser Particle Size Analyzer

Features

• Advanced manufacturing techniques make the unit compact, great in appearance and convenient for use and maintenance. Effective anti-interference technology improves electrical stability and reduces fault rate.
• Two sample feeding modes: small cell and flow cell (automatic circulating & dispersing system (ACDS)); selectable for user with easy replacement.
• Mie scattering and Fraunhoffer diffraction theories are applied in data processing, both include R-R distribution and random distribution for selection.
• Interior computer controlled self-alignment system will focus lens automatically to improve accuracy; separate ACDS makes sample preparation more convenient.
• Specially designed light receiver array with 76 detectors improves resolution. User-friendly interface of test software makes for easy operation with options for saving results, locating details, comparing, merging, editing, deleting, and help.
• Six report forms in English; including cumulative particle size distribution of data and graph, frequency particle size distribution of data, histogram and typical particle diameter range such as D3, D10, D25,D50, D75, D84, D90, D97, D98, etc. Layout, color, and font of the report are editable.

Precise 3-D Self-Alignment System

Performance

• Precise hybrid stepping motor, step angle 0.9°
• MCU system and software system, shortest step 1μm.
• Imported guide, guide screw and connecting axle
• Smooth operation, good following ability, highly precise locating.

Advantage

• Constant alignment: during each test the laser will align itself to illuminate the center of the detector and improve accuracy.
• Free replacement: Light beam stays in alignment even during replacement of small sample cell and flow cell.
• Self-alignment: in case of light path deviation due to slight deformation of instrument (caused by installation location, vibration, thermal expansion or contraction), system will correct itself automatically to maintain accuracy.

ABT-800 Auto Circulate & Dispersion System

• Sample preparation is significant for optimum test results. Before testing, the sample will be dispersed until stable and homogeneous in proper concentration without sedimentation. ABT-9300S incorporates all of these capabilities.
• Ultrasonic System (50W):
  During dispersion, a shock wave of ultrasonic frequency is imparted on particles through water to disperse them fully without breaking. Optimal testing conditions are available under Precise Timing Function.
• Circulating pump:
  Centrifugal assembly is completely made of stainless steel, causing no contamination to the sample. Pump blades will fully agitate sample to make it homogeneous. Adjustable flow rate is suitable for varied particle size or sample with varied density.
• Highly automatic:
  Automatic controllers on liquid level, water supply and drainage as well as a connection to public utilities; which results in an uninterrupted water supply with flush and drainage.

Software

• Test software operates perfectly in any WindowsTM system and comes complete with a user-friendly interface.
• Data processing performed by utilizing the Mie scattering theory. RI’s of varied sample types and mediums are available to ensure accuracy.
• Save, find, delete, merge, and compare test results before printing out in multiple forms. Microsoft Excel data export is available for additional analysis and processing.
• Varied test data and figures are obtainable in one window using serial test, making it easy to compare accuracy and repeatability.
• Real-time monitoring can single out and delete abnormal tests to make results more reliable.
• Integration of test and state: integrate test steps in one window to make testing convenient and efficient.
• Automatic light path adjustment : Software will examine and correct light beams in real-time to make sure beam is centered on the detector.
• Test report can be processed and printed in Word, Excel and WordPad.

Application

• Non-metallic powders such as calcium carbonate, talcum powder, kaolin, zirconium silicate, wollastonite, graphite, silica powder, tourmaline, mica, barite, plaster, bentonite, diamond, quartz, diatomite, feldspar, calamite, clay, garnet, vermiculite, Titanium white powder and etc.
• Metallic powder such as aluminum powder, iron powder, magnesium powder, molybdenum powder, copper powder, zinc powder, other rare metal power, varied alloy powder and etc.
• Pharmaceutical, agricultural pesticide, grinding particle, foodstuff, scientific research, teaching, cement, ceramic, glass, chemical industry, military industry, soil, pigment, oil exploration, geological analysis, river silt, electronic particle and etc.

Specifications

Size range	0.1 μm – 340 μm
Sample feeding mode	Small cell and flow cell
Repeatability error	≤1%(for standard sample D50)
Test time	Normally 1-3 mins
Gross weight (including all accessories and spare parts)	135Kg
Size	660 × 280 × 290 mm3
Power	180 Watt
Voltage	220V / 110V
Precision of self-alignment system	≤1μm