Angstrom Advanced Hydrogen Generating Plant by Natural Gas Steam Reforming

Hydrogen Generating Plant by Natural Gas Steam Reforming

Introduction

The natural gas, prior to pressurization, desulfurization and mixing with aqueous vapor, is passed through a special reformer which is packed with catalyst for cracking and reforming effluent-a mixture of H2 CO2 and CO.After part heat is recovered, hydrogen will be obtained by converting the reforming effluent to reduce the amount of of CO content and the shift gas is purified through PSA to get the pure H2

Specifications

H2 capacity	50-20000 Nm3/h
H2 purity %	>99-99.999%
Work pressure	1.3-2.0MPa

Technical Features

-Safe and reliable operation -High automation -Low operational cost means your investment is recovered in a short period of time -The desorbed gas from PSA can be burned; which can both reduce the fuel consumption and decrease the ventilation of the waste gas.

  

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Angstrom Advanced Hydrogen Generating Plant by Water Electrolysis

Hydrogen Generating Plant by Water Electrolysis    Hydrogen Generating Plant by Water Electrolysis Call for more Information: 781.519.4765 View Technical Knowledgebase Request an Estimate

Hydrogen electrolyte and oxygen electrolyte circulate separately, hydrogen electrolyte pumps into hydrogen cell directly and oxygen electrolyte pumps into oxygen cell directly, and therefore gets higher purity of hydrogen and oxygen gas.

Introduction

Specifications

H2 capacity	2-500 Nm3/h
O2 capacity	1-250 Nm3/h
H2 purity %	>99.9
O2 purity %	>99.5
Power consumption (DC)	< 4.5 kw.h/m3H2
Electrolyte	30% KOH
Work pressure	0.5-5.0MPa

Electrolysis Process Overview

Electrolysis is the passage of a direct electric current through an ionic substance that is either molten or dissolved in a suitable solvent, resulting in chemical reactions at the electrodes and separation of materials. The main components required to achieve electrolysis are : An electrolyte : a substance containing free ions which are the carriers of electric current in the electrolyte. If the ions are not mobile, as in a solid salt then electrolysis cannot occur. A direct current (DC) supply : provides the energy necessary to create or discharge the ions in the electrolyte. Electric current is carried by electrons in the external circuit. Two electrodes : an electrical conductor which provides the physical interface between the electrical circuit providing the energy and the electrolyte. Electrodes of metal, graphite and semiconductor material are widely used. Choice of suitable electrode depends on chemical reactivity between the electrode and electrolyte and the cost of manufacture. For more information https://www.linkedin.com/company/angstrom-advanced?trk=nav_account_sub_nav_company_admin https://angstromadvancedhydrogen.wordpress.com/ https://www.pinterest.com/pin/309481805615112886/ http://angstromadvanced1.blogspot.com/ https://angstromadvancedinc.wordpress.com/

Angstrom Advanced AA8000 Multi-function SEM System

Introductions

Angstrom AA8000-SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.

Features

High Performance

• Field proven image quality
• Upgraded scan speed and pixel resolution.
• Wide variety of optional instrument
• Resolution : 3.0 nm
• Magnification : ~1,000,000X
• Display : Photo 4096X 4096
• Search : 640X480 30fps
• Options : BSE / WDS / EDS / EBSD / Etc.

Gun Coumn

• Gun design for stable current supply
• Dual field objective lens for spherical
• Aberration reduction
• Movable aperture for beam centering
• Upgraded design of magnetic lens (CL/OL)

Chamber & Stage

• 5 axis eucentric stage
• Option: Stage motorization
• EDS,WDS,CCD, Manipulator etc
• 50X60X57mm

Detector

• ET-bar type SE detector
• SE & BSE double image mode
• Option: BSE detector

GUI

• Window based GUI
• PC controlled operation
• Image thumbnail & storage
• Parameter Display

Vacuum System

• Automatic & Manual control
• Automatic Safety System
• P+D.P/ R.P+TMP

Image Analyzer

• Data transfer to Excel
• Particle counter for blob analysis
• Multi-focusing & Tiling
• 3D data view etc

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Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscop

OS-AA Opening Multifunction Scanning Probe Microscope

Introductions

OS-AA SPM system is known for its multi-functionality and full openness. OS-AA system is not just a platform for unconventional experiments but also for further developments.

Features

Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase Imaging with Full digital control 16bit ADC/DAC High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange Input/output signal channel preserved for further system extension Standard external open interface for second developments I-V Curve and Force-Curve Nano-Processing Nano-manipulating with Super-Multimedia technology Designed for Windows Vista/XP/NT/2000/9X Hardcode and Dynamic Code both applied to offline software Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

Specifications

Resolution: AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical Current Sensitivity: ≤10pA Force Sensitivity: ≤ 1nN Positioning Accuracy: ≤ 0.5nm Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC) Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier) DI/DO channels preserved: 8ch DI, 8ch DO

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Angstrom Advanced AA7000 SEM Scanning Electron Microscope

AA7000 SEM Scanning Electron Microscope

Introductions

Angstrom-SEM is a true multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment. On this instrument, there is a perfect balance between stable configuration and an excellent resolution.

Specifications

Resolution 7nm(Option: 5nm@30KV) Magnification 10X ~100,000X Acceleration Voltage 0.6KeV ~ 20KeV (Option: 30KV) Visual Inpection Source Electron induced Display (Tungsten Hair Pin Type) Probe Current nA ~pA for SEM, Max. ~ 3uA Bean Control Beam Shift : ±125um, Beam Rotation: 360° SE Detector High Sensitivity SE detector Image Signal process 5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880) Work-Piece Positioning Tilted Holder 0°~60° (Max 90°) 5 Axis Stage Movement Stroke X/Y/Z/=-40/40/40mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R) Vacuum system Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge) Anti-Vibration Air-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site Control Rack PC Environmental Operation Operating system : Windows Serial communication: control data interface Display System 22” LCD monitor Port 3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation GUI& Tools BSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display Image Processor Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis) Automatic Control Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology) Chamber Volume F210 X190 (H) mm EDS port: 25° For more information  https://angstromadvancedhydrogen.wordpress.com/ http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html http://angstromadvanced1.blogspot.com/ https://angstromadvancedinc.wordpress.com/

Angstrom Advanced AA5000 Multi-function SPM Systems

Introductions

AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.

Features

Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM; Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; SPM can be in liquid; Real-time temperature and humidity detecting; Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve; Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode; Fast automatically tip-engaging Simply change of the tip holder to switch between STM and AFM; Full digital control, auto system status recognition; Adjustable lightening inside With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved; Controller and Computer connected through a 10M/100M Fast Ethernet; Large sample size: up to diameter 45mm, 30mm thick; Online Control Software and offline Image Processing Software for Windows; Trace-Retrace scan, Back-Forward scan; Online real-time 3D image; Automatically Brightness and Contrast refresh; Data can be loaded out for further analysis; Nano-Movie function: Continuous data collection, storage and replay; Multi-Analysis: Granularity and Roughness; Tip Estimation and Image Re-construction; Modularized design for convenience of maintenance and future upgrade; Second display monitor and optical microscope system attachable;

Specifications

Functions Atomic Force Microscope (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; Lateral Force Microscope (LFM); Scanning Tunneling Microscope (STM); Conductive AFM, SPM in liquid, Environmental Control SPM; Nano-Processing System including Lithography Mode and Vector Scan Mode; Resolution AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical; Technical Parameters Current Sensitivity: less than or equal to 10pA; Force Sensitivity:less than or equal to 5pN; Image Pixels: 128X128, 256X256, 512X512, 1024X1024, 2048X2048; Scan Angle: 0-360 degree adjustable; Scan Rate: 0.1-100Hz adjustable; Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V; Temperature Sensitivity: 0.1Celsius, Humidity Sensitivity: 0.5%RH; Sample Size: Up to 50mmx50mm, 30mm thick; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm; Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x; Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; DAC: 20 channels of 16-bit DAC; ADC: 20 channels of 16-bit ADC; Communication Interface: 10M/100M Fast Ethernet; For more information https://angstromadvancedhydrogen.wordpress.com/ http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html http://angstromadvanced1.blogspot.com/ https://angstromadvancedinc.wordpress.com/ http://angstrom-advanced1.blogspot.com/ http://angstrom-advanced.blogspot.com/ http://angstromadvancedinc1.blogspot.com

Angstrom Advanced AA3000 Scanning Probe Microscop

AA3000 Scanning Probe Microscope

Introduction

AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance Atomic-scale of resolution Large sample size DSP (Digital Signal Processor)- for great performance Real time operating system embedded Fast Ethernet connection with computer Multi-Function Atomic Force Microscope (AFM) Scanning Tunneling Microscope (STM) Lateral Force Microscope (LFM) Force Analysis: I-V Curve, I-Z Curve, Force Curve Online real-time 3D image for better observation Multi-channel signals for more sample details Trace-Retrace scan, Back-Forward scan Multi-Analysis: Granularity and Roughness Data load-out for further analysis Easy Operation Fast automatically tip-engaging Simple change of the tip holder to switch between STM and AFM Full digital control, auto system status recognition Software-based sample movement Nano-Movie function: Continuous data collection, storage and replay Modularized design for convenient maintenance and future upgrades

Specifications

Functions Atomic Force Microscope (AFM) Scanning Tunneling Microscope(STM) Lateral Force Microscope (LFM) Resolution AFM: 0.26nm lateral, 0.1nm vertical Scanning Tunneling Microscope(STM) Technical Parameters X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet Mechanics Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm; Softwares Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x

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Angstrom Advanced AA2000 Atomic Force Microscope

AA2000 Atomic Force Microscope

Features

High Performance Atomic-scale of resolution Large sample size DSP(Digital Signal Processing) for great performance Real time operating system embedded Fast Ethernet connection with computer Multi-Function Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) Force Analysis: I-V Curve, I-Z Curve, Force Curve Online real-time 3D image for better observation Multi-channel signals for more sample details Trace-Retrace scan, Back-Forward scan Multi-Analysis: Granularity and Roughness Data load-out for further analysis Easy Operation Fast automatically tip-engaging Easy change of the tip holder, for simple switching between STM and AFM Full digital control, auto system status recognition Software-based sample movement Nano-Movie function: Continuous data collection, storage and replay Modularized design for convenient maintenance and future upgrades

Specifications

Functions Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) Resolution AFM: 0.26nm lateral, 0.1nm vertical Technical Parameters X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet Mechanics Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm Software Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x For more information https://angstromadvancedhydrogen.wordpress.com/ http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html https://www.pinterest.com/pin/309481805615112886/

Angstrom Advanced AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

Introduction

AXFG series detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tube are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, AXFG X-ray flaw detector is the best choice for most applications.

Models and Specifications

Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) AXFG-1605 60~160 1.5 0.8 × 0.8 40±5° 19 14.5 225 × 225 × 550 AXFG-2005 100~200 2.0 2.0 × 2.0 40 ± 5° 30 18 285 × 285 × 615 AXFG-2505 150~250 2.5 2.0 × 2.0 40 ± 5° 40 30.5 320 × 320 × 640 AXFG-3005 170~300 3.0 2.5 × 2.5 40 ± 5° 50 36.5 345 × 345 × 670

Angstrom Advanced AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube) Introduction

AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube)

Introduction

AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate non destructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure.

Types and Specifications

Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) cone target planar target cone target planar target AXFH-1005 50~100 1.2 0.8 × 0.8 30±5° 25±5° 4 6 11.1 190 × 190 × 520 AXFH-1605 60~160 1.5 0.8 × 0.8 30±5° 25±5° 12 15 15.2 225 × 225 × 585 AXFH-2005 100~200 2.0 1.5 × 1.5 30±5° 25±5° 24 27 23 285 × 285 × 665 AXFH-2505 150~250 2.5 2.0 × 2.3 30±5° 25±5° 34 37 35 320 × 320 × 730 AXFH-3005 170~300 3.0 2.3 × 2.3 30±5° 25±5° 44 47 45.5 345 × 345 × 830 AXFH-3205 180~320 3.2 2.5 × 2.3 30±5° 25±5° 45 50 45.5 345 × 345 × 830 AXFH-3505 180~350 3.4 2.8 × 3.0 30±5° 25±5° 52 55 47 345 × 345 × 800

Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

Introduction

The AXFQ series flaw detectors are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on.The glass x-ray tube allows to get images of excellent quality and clarity.

Types and Specifications

Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) AXFQ-1005 50~100 1.2 0.8 × 0.8 40° 8 11.1 190 × 190 × 520 AXFQ-1605 60~160 1.5 0.8 × 0.8 40° 19 15.2 225 × 225 × 585 AXFQ-2005 100~200 2.0 1.5 × 1.5 40 ± 5° 30 23 285 × 285 × 665 AXFQ-2505 150~250 2.5 2.0 × 2.3 40 ± 5° 40 35 320 × 320 × 730 AXFQ-3005 170~300 3.0 2.3 × 2.3 40 ± 5° 50 45.5 345 × 345 × 830 AXFQ-3205 180~320 3.2 2.5 × 2.3 40 ± 5° 55 45.5 345 × 345 × 830 AXFQ-3505 180~350 3.4 2.8 × 3.0 40 ± 5° 60 47 345 × 345 × 800

 

Angstrom Advanced ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument

ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument Introduction ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 can be used for many different applications – Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.. Features Perfect incorporation of the hardware and software, allows ADX-8000 to perform different types of analysis for researchers from various fields; High precision of the diffraction angle measurement allows ADX-8000 to obtain the more accurate data; Higher stability of the X-ray generator control system provides excellent measurement accuracy; Simple and effective design makes ADX-8000 convenient for operation and user friendly. Software General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al. Qualitative Analysis The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match Plot and Export The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted. Parts and Specifications X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 600W, 1200W Tube voltage 40 kV continuously adjustable Tube current 13-30mA continuously adjustable X-ray tube Cu (2.4KW) Focus dimension: 1×10 mm2 LFF Ceramic or Glass Stability ≤ 0.001% Goniometer Goniometer θ – θ Diffraction circle semi-diameter 150mm Scan range of 2θ -3°-150° Continuous scanning rate 0.0012°-70°/min Setting speed of angle 1500°/min Scan mode θ-θ linkage, 2θ,2θ continuous or step scanning One way repeatability of θ ≤ 0.0001° Minimal stepping angle 0.0001° Precision of θd or θs ≤ 0.0001° Filter Ni Slits ≤ Divergence slit, Scattering slit, receiving slit; Record Unit Counter Proportional Counter Maximal CPS 5×105 CPS , 5×107 CPS Proportion counter energy spectrum resolution ≤ 25%(Cu, Ka) Detectable high voltage 1500-2100 continuous tune High voltage of the counter differential or integral, automatic PHA, dead time emendation System detector stability ≤ 0.03% Sample Stage Z Adjustable Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.1% Micro Structure Micro Structure analysis, +/-0.5nm Micro Diffraction Micro sample or area, 2nm-19 um Dimensions 24 X 16 X 26 Inches

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Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Introduction

ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

Features

Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis,

Crystallography, Texture analysis, Transmission, Thin film analysis.

ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature. ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. 

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