Thursday, May 9, 2013

Angstrom Advanced AA8000 Scanning Electron Microscope


Angstrom Advanced AA8000 Scanning Electron Microscope

Angstrom Advanced Inc., AA8000 SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom advanced SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom advanced SEM pursues compact SEM design which is great for office environment. Angstrom advanced SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.



High Performance
  • Field proven image quality
  • Upgraded scan speed and pixel resolution.
  • Wide variety of optional instrument
  • Resolution : 3.0 nm
  • Magnification : ~1,000,000X
  • Display : Photo 4096X 4096
  • Search : 640X480 30fps
  • Options : BSE / WDS / EDS / EBSD / Etc.
Gun Coumn
  • Gun design for stable current supply
  • Dual field objective lens for spherical
  • Aberration reduction
  • Movable aperture for beam centering
  • Upgraded design of magnetic lens (CL/OL)
Chamber & Stage
  • 5 axis eucentric stage
  • Option: Stage motorization
  • EDS,WDS,CCD, Manipulator etc
  • 50X60X57mm
Detector
  • ET-bar type SE detector
  • SE & BSE double image mode
  • Option: BSE detector
GUI
  • Window based GUI
  • PC controlled operation
  • Image thumbnail & storage
  • Parameter Display
Vacuum System
  • Automatic & Manual control
  • Automatic Safety System
  • R.P+D.P/ R.P+TMP
Image Analyzer
  • Data transfer to Excel
  • Particle counter for blob analysis
  • Multi-focusing & Tiling
  • 3D data view etc