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Angstrom Advanced Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)
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Angstrom Advanced Combined Scanning Force Microscope (SPM), Atomic Force microscope (AFM) and Lateral Force Microscope (LFM)
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Full range of Angstrom Advanced STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing
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Full range of Angstrom Advanced STM, AFM, LFM, MFM, EFM
Full openness for further developments |
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Angstrom Advanced AA8000 combines high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment
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SPM / SEM / AFM
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