Angstrom Advanced AA2000 Atomic Force Microscope

AA2000 Atomic Force Microscope

Features

High Performance Atomic-scale of resolution Large sample size DSP(Digital Signal Processing) for great performance Real time operating system embedded Fast Ethernet connection with computer Multi-Function Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) Force Analysis: I-V Curve, I-Z Curve, Force Curve Online real-time 3D image for better observation Multi-channel signals for more sample details Trace-Retrace scan, Back-Forward scan Multi-Analysis: Granularity and Roughness Data load-out for further analysis Easy Operation Fast automatically tip-engaging Easy change of the tip holder, for simple switching between STM and AFM Full digital control, auto system status recognition Software-based sample movement Nano-Movie function: Continuous data collection, storage and replay Modularized design for convenient maintenance and future upgrades

Specifications

Functions Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) Resolution AFM: 0.26nm lateral, 0.1nm vertical Technical Parameters X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet Mechanics Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm Software Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x For more information https://angstromadvancedhydrogen.wordpress.com/ http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html https://www.pinterest.com/pin/309481805615112886/