Angstrom Advanced: Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope

Multi-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase
Imaging with Full digital control 16bit ADC/DAC
High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange
Input/output signal channel preserved for further system extension
Standard external open interface for second developments
I-V Curve and Force-Curve
Nano-Processing
Nano-manipulating with Super-Multimedia technology
Designed for Windows Vista/XP/NT/2000/9X
Hardcode and Dynamic Code both applied to offline software
Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

Specifications

Resolution:	AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical
Current Sensitivity:	≤10pA
Force Sensitivity:	≤ 1nN
Positioning Accuracy:	≤ 0.5nm
Output channels preserved:	6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved:	16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved:	8ch DI, 8ch DO

Angstrom Advanced