Angstrom Advaned Atomic Force Microscope and Scanning Force Microscope Software

Angstrom Advaned Atomic Force Microscope and Scanning Force Microscope Software

The Software is available with the following data types of images

AFM Contact Mode:       Topography — the rise and fall of the sample surface.       Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can       be reflected by the Photodectetor’s Up-Down signal.       Friction - lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal.

AFM Tapping Mode:       Topography — the rise and fall of the sample surface.       Amplitude — cantilever oscillating amplitude changes because of the rise and fall of sample topography.       Phase — cantilever oscillating phase changes because of the sample material characteristics.

Scanning Tunneling Microscope:       Topography —the rise and fall of the sample surface.       Current — Tunneling current changes between tip and sample surface.

Angstrom Advanced Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

The SPM Controller in Angstrom Advanced atomic force microscopes handles all SPM electronics such as signal processing and feedback programming. The Controller inputs commands from a control computer via 60 pin cable and outputs the control signals that are needed for operating an AFM stage. Additional signals from the stage are relayed through the SPM Controller via the Network cable to the control computer. At the rear of the Controller, in addition to the Network cable connection, there are two input/output ribbon cables. A 60-pin cable is used to send and receive signals from the microscope stage. A second 50-pin cable is used for accessing all of SPM Controllers signals for testing or experimentation.

Angstrom Advanced Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

Base of Atomic Force Microscope and Scanning Force Microscope

The base of Atomic Force Microscope holds the detector, AFM Head.It also has environmental control attachment along with other optional attachments such as Vibration Isolation System.

AFM

Angstrom Advanced Renewable Power Generating System Introduction

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    Currently, this patented technology can be applied in 2NM3 – 1000NM3/Hour hydrogen generating systems, and therefore Angstrom Advanced Inc. could provide a variety of renewable energy generating systems, customized for different clients. This technology represents a bright future of massive production and utilization of hydrogen in the 21st century.

Angstrom Advanced Atomic Force Microscope and Scanning Force Microscope Head

AFM Head holds the following components:	XY Translation Stage: Holds probe head, movable in XY direction by XY translation screws and in Z direction by controls in software
Position Sensitive Photo detector (PSPD):	Detects laser deflections, which is then converted into a topographical map
PSPD adjustment screws:	Controls position of PSPD; screw on left controls up and down adjustment; screw on right controls left right adjustment
Laser Beam Steering Screws:	Controls position of laser on back of cantilever

Angstrom Advanced Atomic Force Microscope and Scanning Force Microscope Probes

Different kinds of probes can be used in an Atomic Force Microscope. Proper probe selection depends on sample characteristics and system conditions.

Metal Probes:	Probe used in STM must be conductive and a atomic-sharp tip is required. STM tips can be obtain by simply cut (for Pt-Ir) and electronically eroded (for tungsten).
Cantilever Probes:	A flexible cantilever with an atomic-sharp tip is widely used in AFM as below. Most cantilever probes are made by Si or SiN with different types of coatings and different shape and size. Different samples and system conditions required different cantilevers.

Contact Mode:	Theoretically all kinds of cantilever probes can be used in contact mode. But because of the different force constant parameters, harder cantilever will cause the sample damages with the same amount of deflection.
Tapping Mode:	An oscillating cantilever is required in Tapping mode. So theoretically using cantilevers with higher resonance frequency will give better resolution. Cantilevers with larger force constant and higher resonance frequency (normally over 200kHz) should be chosen.

Angstrom Advanced Scanning Tunneling Mode

STM relies on “tunneling current” between the probe and the sample to sense the topography of the sample. The STM probe, a sharp metal tip (in the best case, atomically sharp), is positioned a few atomic diameters above a conducting sample which is electrically biased with respect to the tip. At a distance under 1 nanometer, a tunneling current will flow from sample to tip. In operation, the bias voltages typically range from 10 to 1000 mV while the tunneling currents vary from 0.1 to10 nA.

The tunneling current changes exponentially with the tip-sample separation, typically decreasing by a factor of two as the separation is increased 0.2 nm. The exponential relationship between the tip separation and the tunneling current makes the tunneling current an excellent parameter for sensing the tip-to-sample separation. In essence, a reproduction of the sample surface is produced by scanning the tip over the sample surface and sensing the tunneling current.

STM relies on a precise scanning technique to produce very high-resolution, three-dimensional images of sample surfaces. The STM scans the sample surface beneath the tip in a raster pattern while sensing and outputting the tunneling current to the SPM Controller. The digital signal processor (DSP) in the Controller controls the Z position of the Piezo Scanner based on the tunneling current error signal. The STM operates in both “constant height” and “constant current” data modes, depending on the Feedback Gain settings. The DSP always adjusts the height of the tip based on the tunneling current error signal, but if the feedback gains are set extremely low (e.g., Integral Gain < 15 and Proportional Gain < 15), the piezo remains at a nearly constant height while tunneling current data is collected. With the Feedback Gains high (e.g., Integral Gain >15 and Proportional Gain >15), the Scanners Piezo height changes to keep the tunneling current nearly constant, and changes in piezo height are used to construct the image. The exponential relationship between tip-sample separation and tunneling current allows the tip height to be controlled very precisely.

Angstrom Advanced Portable Hydrogen Generator by Water Electrolysis

Angstrom Advanced Portable Hydrogen Generator by Water Electrolysis

For more information please call Angstrom Advanced at: 781.519.4765

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Introduction:

The hydrogen electrolyte and oxygen electrolyte circulate separately. Both electrolytes pump into their respective, separate cells directly, allowing for the collection of higher purity hydrogen and oxygen.

Specifications
H2 capacity	0.18-30 Nm3/h
O2 capacity	0.09-15 Nm3/h
H2 purity %	>99.9
O2 purity %	>99.5
Power consumption (DC)	< 4.5 kw.h/m3H2
Electrolyte	Pressurized
Work pressure	0.5-3.0MPa

Angstrom Advanced Cryogenic Technology Liquid Nitroge/Oxygen/Argon Plant

Angstrom Advanced Liquid Nitroge/Oxygen/Argon Plant by Cryogenic Technology

For more information please call Angstrom Advanced at: 781.519.4765

Request an Estimate

Angstrom Advanced Liquid Nitrogen/Oxygen/Argon Plants by Cryogenic Technology are top of the line systems. Our generator applications cover a range of production rates depending on the settings employed: Oxygen: 5~10,000L/H, Nitroge: 5~10,000L/H, and Argon: 1~500L/H. The Cryogenic Engine features Fully Automatic G-M cold head with integral contrlos. It also includes high efficiency frequency drive with water cooling or optional air cooling. Fully automatic programmable logic controls (PLC) provide many features and modes including auto start, timed run, auto purge, etc. At the time of the order, an Optional Chiller can be attached to liquefier unit to allow continuous operation up to 45°C. The output purity of each gas generated from the plant are as follows: Nitrogen-99.9999% Oxygen -99.95% Argon- 99.9999%.

Specifications
Capasity	5-10,000L/H
Purity	>99%
Input Air Pressure	0-2MPa
Working Pressure	0-2MPa
Temperature	-195°C
Power Supply	AC 220V/50Hz, 110V/60Hz

Angstrom Advanced XRD and XRF instruments

XRD / XRF

	Angstrom Advanced ADX-2500 X-ray Diffraction Instrument Angstrom Advanced ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
	Angstrom Advanced ADX-2700 X-ray Diffraction Instrument Angstrom Advanced ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.
	Angstrom Advanced AXFQ series portable directional X-ray flaw detector Angstrom Advanced AXFQ series flaw detectors are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on.The glass x-ray tube allows to get images of excellent quality and clarity.
	Angstrom Advanced AXFH series portable panoramic X-ray flaw detector Angstrom Advanced AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate non destructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure.
	Angstrom Advanced AXFG series portable X-ray flaw detector Angstrom Advanced AXFG series detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tube are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, AXFG X-ray flaw detector is the best choice for most applications.

Angstrom Advanced AA8000 Multi-function SEM System

Angstrom Advanced AA8000 Multi-function SEM System

www.angstrom-advanced.com

For more information please call Angstrom Advanced at: 781.519.4765

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Introduction

Angstrom Advanced AA8000 SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.

Features

High Performance Field proven image quality Upgraded scan speed and pixel resolution. Wide variety of optional instrument Resolution : 3.0 nm Magnification : ~1,000,000X Display : Photo 4096X 4096 Search : 640X480 30fps Options : BSE / WDS / EDS / EBSD / Etc.

Gun Coumn Gun design for stable current supply Dual field objective lens for spherical Aberration reduction Movable aperture for beam centering Upgraded design of magnetic lens (CL/OL)

Chamber & Stage 5 axis eucentric stage Option: Stage motorization EDS,WDS,CCD, Manipulator etc 50X60X57mm

Detector ET-bar type SE detector SE & BSE double image mode Option: BSE detector

GUI Window based GUI PC controlled operation Image thumbnail & storage Parameter Display

Vacuum System Automatic & Manual control Automatic Safety System R.P+D.P/ R.P+TMP

Image Analyzer Data transfer to Excel Particle counter for blob analysis Multi-focusing & Tiling 3D data view etc

Z ELECTRON OPTIC SYSTEM	Resolution 3.0 nm @30KeV SE/ 4.0nm @BSE Magnification 10 ~ 1,000,000X Image Color Optical Microscope Image (Option) Beam Scan Mode Search, Inspection, Photo (3step) Accelerating Voltage 0.5kV~30kV Electron Gun Type Tungsten Filament Bias System Linked with Acc. Voltage plus continuous voltage control Gun Alignment Pre-centered cartridge Condenser Lens Electromagnetic 2 stages Objective Lens Electromagnetic 1 stages Stigmator 8 Pole Electromagnetic Type Detector Bar Type SE Detector (SE-BSE Conversion Mode Without BSE detector for Non-coating sample inspection) Image Shift 4 Pole Electromagnetic Type Automation Function Auto-Focus, Auto-Stigmatism, Auto Contrast/Brightness, Emission Current etc.
DISPLAY	Frame Memory & Scan Search (640X480) >30 frame/sInspection (1280X960)  30 frame/sPhoto(4096X4096)  2 frame/s
IMAGE ANALYZER	Image Analyzer Particle Counter Multi-Focusing/ Image Tiling/ 3D-View/Enhancement/ Color Transformation/Filters/ Blob Analysis (Single/Multiple/Grouping), Histogram, Excel Data, Point Measurement
STAGE SYSTEM	Movement (X/Y/Z) mm 50/ 60/ 57mm Tilt -30~60° (Max 90 °) Rotation 360° Stage Motorization X,Y,R (Standard) X,Y,Z,Tilt,Rotation (Option)
VACUUM SYSTEM	Vacuum Control Type Full automation with safety system Vacuum System Rotary Pump + Diffusion Pump or Rotary Pump + Turbo Pump (Option)
CONTROL SYSTEM	Computer System Intel Pentium 4(Dual Co-Processor) Memory ≥ 256MB, Control Data Interface Operation System Image Acquisition

Angstrom Advanced Nitrogen/Oxygen Generating Plant by Pressure Swing Adsorption

Angstrom Advanced Nitrogen/Oxygen Generating Plant by Pressure Swing Adsorption

Angstrom Advanced Nitrogen/Oxygen Generating Plant by Pressure Swing Adsorption

For more information please call: 781.519.4765

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Angstrom Advanced PSA Nitrogen/Oxygen generator gets N2 / O2 by pressure swing adsorption principle at normal temperature using clean compressed air as raw material and carbon molecular sieve as adsorbent. Because of the different adsorption of oxygen and nitrogen on carbon molecular sieve surface as well as different diffusion rate through the open/close of program control valve; separation of oxygen and nitrogen is achieved and N2 of required purify is created.

Specifications
N2 capacity	1-2000 Nm3/h
N2 purity %	>95-99.999%
O2 capacity	10-500 Nm3/h
O2 purity %	>95-99.9%
Dew Point	≤-40C
Transmittance Accuracy	± 0.5%T
Transmittance Repeatability	0.3%T
Stray Light	< 0.2%T (NaNO2)

Angstrom Advanced Atomic Force Microscope and Scanning Probe Microscope Tipholders

Angstrom Advanced AFM Tipholder:
1 Tip holder Handle
2 Spring Clip which secure the cantilever
3 Cantilever notch

Angstrom Advanced SPM Tipholder:
1 Tip holder Handle
2 Installation tube for Pt-Ir or tungsten tips