Angstrom Advanced AA2000 Atomic Force Microscope
For more information please call Angstrom Advanced at: 781.519.4765
www.angstrom-advanced.com
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High Performance
· Atomic-scale of resolution
· Large sample size
· DSP(Digital Signal Processing) for great performance
· Real time operating system embedded
· Fast Ethernet connection with computer
Multi-Function
· Atomic Force Microscope (AFM)
· Lateral Force Microscope (LFM)
· Force Analysis: I-V Curve, I-Z Curve, Force Curve
· Online real-time 3D image for better observation
· Multi-channel signals for more sample details
· Trace-Retrace scan, Back-Forward scan
· Multi-Analysis: Granularity and Roughness
· Data load-out for further analysis
Easy Operation
· Fast automatically tip-engaging
· Easy change of the tip holder, for simple switching between STM and AFM
· Full digital control, auto system status recognition
· Software-based sample movement
· Nano-Movie function: Continuous data collection, storage and replay
· Modularized design for convenient maintenance and future upgrades
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| Functions | Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) |
| Resolution | AFM: 0.26nm lateral, 0.1nm vertical |
| Technical Parameters | X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz |
| Electronics | CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet |
| Mechanics | Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm |
| Software | Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x |
