Angstrom Advanced: Angstrom Advanced AA2000 Atomic Force Microscope

Features

High Performance

· Atomic-scale of resolution

· Large sample size

· DSP(Digital Signal Processing) for great performance

· Real time operating system embedded

· Fast Ethernet connection with computer

Multi-Function

· Atomic Force Microscope (AFM)

· Lateral Force Microscope (LFM)

· Force Analysis: I-V Curve, I-Z Curve, Force Curve

· Online real-time 3D image for better observation

· Multi-channel signals for more sample details

· Trace-Retrace scan, Back-Forward scan

· Multi-Analysis: Granularity and Roughness

· Data load-out for further analysis

Easy Operation

· Fast automatically tip-engaging

· Easy change of the tip holder, for simple switching between STM and AFM

· Full digital control, auto system status recognition

· Software-based sample movement

· Nano-Movie function: Continuous data collection, storage and replay

· Modularized design for convenient maintenance and future upgrades

Functions	Atomic Force Microscope (AFM) Lateral Force Microscope (LFM)
Resolution	AFM: 0.26nm lateral, 0.1nm vertical
Technical Parameters	X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet
Mechanics	Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software	Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x

Angstrom Advanced