Angstrom Advanced AA2000 High Performance Multi-Functional Atomic Force Microscope

Angstrom Advanced AA2000 High Performance Multi-Functional Atomic Force Microscope

Features

High Performance 

·         Atomic-scale of resolution

·         Large sample size

·         DSP(Digital Signal Processing) for great performance

·         Real time operating system embedded

·         Fast Ethernet connection with computer

Multi-Function

·         Atomic Force Microscope (AFM)

·         Lateral Force Microscope (LFM)

·         Force Analysis: I-V Curve, I-Z Curve, Force Curve

·         Online real-time 3D image for better observation

·         Multi-channel signals for more sample details

·         Trace-Retrace scan, Back-Forward scan

·         Multi-Analysis: Granularity and Roughness

·         Data load-out for further analysis

Easy Operation

·         Fast automatically tip-engaging

·         Easy change of the tip holder, for simple switching between STM and AFM

·         Full digital control, auto system status recognition

·         Software-based sample movement

·         Nano-Movie function: Continuous data collection, storage and replay

·         Modularized design for convenient maintenance and future upgrades

	HGH3000			HGH5000
Technical parameter	Purity	Working Pressure	Flux	Purity	Working Pressure	Flux
Name	(%)	(Mpa)	(ml/min)	(%)	(Mpa)	(ml/min)
Hydrogen	99.996	0-0.4	0-3000	99.996	0-0.4	0-5000
Voltage of Power Supply	VAC 220V±10%; 50HZ±5% VAC 110V±10%; 60HZ±5%
Environment Temperature	0-40℃ Relative Humidity≤85%
Environment Condition	Without large quantity of dust and caustic gas
Maximum Power	1500W			2500W