Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope

Angstrom Advanced Inc. OS-AA Opening Multifunction Scanning Probe Microscope

Introduction

Angstrom Advanced OS-AA SPM system is known for its multi-functionality and full openness. OS-AA system is not just a platform for unconventional experiments but also for further developments.

Features

Multi-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase Imaging with Full digital control 16bit ADC/DAC High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange Input/output signal channel preserved for further system extension Standard external open interface for second developments I-V Curve and Force-Curve Nano-Processing Nano-manipulating with Super-Multimedia technology Designed for Windows Vista/XP/NT/2000/9X Hardcode and Dynamic Code both applied to offline software Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

Specifications

Resolution:	AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical
Current Sensitivity:	≤ 10pA
Force Sensitivity:	≤ 1nN
Positioning Accuracy:	≤ 0.5nm
Output channels preserved:	6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved:	16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved:	8ch DI, 8ch DO