Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

Introduction

The AXFQ series flaw detectors are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on.The glass x-ray tube allows to get images of excellent quality and clarity.

Types and Specifications

Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) AXFQ-1005 50~100 1.2 0.8 × 0.8 40° 8 11.1 190 × 190 × 520 AXFQ-1605 60~160 1.5 0.8 × 0.8 40° 19 15.2 225 × 225 × 585 AXFQ-2005 100~200 2.0 1.5 × 1.5 40 ± 5° 30 23 285 × 285 × 665 AXFQ-2505 150~250 2.5 2.0 × 2.3 40 ± 5° 40 35 320 × 320 × 730 AXFQ-3005 170~300 3.0 2.3 × 2.3 40 ± 5° 50 45.5 345 × 345 × 830 AXFQ-3205 180~320 3.2 2.5 × 2.3 40 ± 5° 55 45.5 345 × 345 × 830 AXFQ-3505 180~350 3.4 2.8 × 3.0 40 ± 5° 60 47 345 × 345 × 800

 

Angstrom Advanced ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument

ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument Introduction ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 can be used for many different applications – Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.. Features Perfect incorporation of the hardware and software, allows ADX-8000 to perform different types of analysis for researchers from various fields; High precision of the diffraction angle measurement allows ADX-8000 to obtain the more accurate data; Higher stability of the X-ray generator control system provides excellent measurement accuracy; Simple and effective design makes ADX-8000 convenient for operation and user friendly. Software General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al. Qualitative Analysis The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match Plot and Export The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted. Parts and Specifications X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 600W, 1200W Tube voltage 40 kV continuously adjustable Tube current 13-30mA continuously adjustable X-ray tube Cu (2.4KW) Focus dimension: 1×10 mm2 LFF Ceramic or Glass Stability ≤ 0.001% Goniometer Goniometer θ – θ Diffraction circle semi-diameter 150mm Scan range of 2θ -3°-150° Continuous scanning rate 0.0012°-70°/min Setting speed of angle 1500°/min Scan mode θ-θ linkage, 2θ,2θ continuous or step scanning One way repeatability of θ ≤ 0.0001° Minimal stepping angle 0.0001° Precision of θd or θs ≤ 0.0001° Filter Ni Slits ≤ Divergence slit, Scattering slit, receiving slit; Record Unit Counter Proportional Counter Maximal CPS 5×105 CPS , 5×107 CPS Proportion counter energy spectrum resolution ≤ 25%(Cu, Ka) Detectable high voltage 1500-2100 continuous tune High voltage of the counter differential or integral, automatic PHA, dead time emendation System detector stability ≤ 0.03% Sample Stage Z Adjustable Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.1% Micro Structure Micro Structure analysis, +/-0.5nm Micro Diffraction Micro sample or area, 2nm-19 um Dimensions 24 X 16 X 26 Inches

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Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Introduction

ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

Features

Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis,

Crystallography, Texture analysis, Transmission, Thin film analysis.

ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature. ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. 

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ANGSTROM ADVANCED ADX-2500 X-RAY DIFFRACTION INSTRUMENT

ADX-2500 X-ray Diffraction Instrument
Introduction
ADX-2500 X-ray Diffraction Instrument is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software,ADX-2500 is a diffraction system according to the practical requirements in many fields. ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
Features
Perfect incorporation of the hardware and software, allows ADX-2500 to perform different types of analysis for researchers from various fields; High precision of the diffraction angle measurement allows ADX-2500 to obtain the more accurate data; Higher stability of the X-ray generator control system provides excellent measurement accuracy; Simple and effective design makes ADX-2500 convenient for operation and user friendly.
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern. Profile fitting and overlapped peeks separation With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain. Qualitative Analysis The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Plot and Export The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Parts and Specifications
X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 4 kW Tube voltage 10-60 kV Tube current 5-80 mA X-ray tube Cu, Fe, Co, Cr, Mo et al (2.4 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2 Stability ≤ 0.01% Goniometer Goniometer thetaθ/thetaθ Diffraction circle semi-diameter 225mm Scan range of 2θ -6°-160° Continuous scanning rate 0.06°-50°/min Setting speed of angle 1500°/min Scan mode θ-2θ linkage, θ,2θ one way: continuous or step scanning One way repeatability of 2θ ≤ 0.001° Minimal stepping angle 0.001° Precision of 2θ ≤ 0.02° Record Unit Counter PC or SC Maximal CPS 5×106 CPS Proportion counter energy spectrum resolution ≤ 25%(PC), ≤ 55%(SC) Detectable high voltage 1500-2100 V continuous tune High voltage of the counter differential or integral, automatic PHA, dead time emendation System detector stability ≤ 0.01% Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.5% Dimension 1000 × 800 × 1600 mm

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Magnetic Resonance Imaging MRI-300

Magnetic Resonance Imaging MRI-300

Introduction

Magnetic Resonance Imaging MRI-300 is specially designed for living animal’s observation. it provides high contrast images and accurate messages in vivo intuitively, equipped with permanent magnet. As a powerful and non-destructive MRI instrument, this system is widely used in life sciences to study tissue structure in vivo and their contrast message dispense with special maintenance cost....

Applications

Contrast agent MRI of subcutaneous tumor Multilayer MRI of 150g rat's head MRI Specifications Magnet: permanent,0.5±0.05T: Magnetic field uniformity: ≤ 20ppm(60mm×60mm×60mm); Magnetic field stability: ≤300Hz/Hour; Magnet temperature control: dual system of nonlinear precise temperature control, temperature tunable from 25℃ to 35℃ ; temperature control accuracy ±0.05℃ ; RF field: pulse frequency: 2~30MHz; frequency control accuracy: 0.1Hz; RF power amplifier: peak-to-peak value > 300W; Maximum bandwidth is 2000KHz; MRI gradient: X, Y, Z-peak intensity > 2.5Gauss/cm; Probe caliber: 60mm; Effective detection area: Ø60mm×H60mm; Image quality: image linearity (x, y, z three direction) > 90%, spatial resolution better than 1mm; Maximum echo peak number is 18,000; minimum echo time is 360us; Based on PCI bus industrial control computer platform, dual-core CPU, 4G DDR memory, 500G hard disk, DVD_R/W CD-ROM. Power supply: 220V, 50Hz Work temperature: 22~28°C Environment humidity: 30~70% Dimensions (L, W, H): 1540mm×800mm×1200mm. Total Weight:0.8 tons(Magnet 0.7 tons, control cabinet 0.1 tons)

AA7000 SEM Scanning Electron Microscope

AA7000 SEM Scanning Electron Microscope Introductions Angstrom-SEM is a true multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment. On this instrument, there is a perfect balance between stable configuration and an excellent resolution. Specifications Resolution 7nm(Option: 5nm@30KV) Magnification 10X ~100,000X Acceleration Voltage 0.6KeV ~ 20KeV (Option: 30KV) Visual Inpection Source Electron induced Display (Tungsten Hair Pin Type) Probe Current nA ~pA for SEM, Max. ~ 3uA Bean Control Beam Shift : ±125um, Beam Rotation: 360° SE Detector High Sensitivity SE detector Image Signal process 5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880) Work-Piece Positioning Tilted Holder 0°~60° (Max 90°) 5 Axis Stage Movement Stroke X/Y/Z/=-40/40/40mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R) Vacuum system Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge) Anti-Vibration Air-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site Control Rack PC Environmental Operation Operating system : Windows Serial communication: control data interface Display System 22” LCD monitor Port 3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation GUI& Tools BSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display Image Processor Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis) Automatic Control Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology) Chamber Volume F210 X190 (H) mm EDS port: 25°

AA6000 MINI DESKTOP SCANNING ELECTRON MICROSCOPE

Introductions

Angstrom-mini-SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment, and perfect balance between stable configuration and excellent resolution.

Specifications

Resolution 7nm(Option: 5nm@20KV) Acceleration Voltage 0.6KeV ~ 20KeV (Option: 30KV) Visual Inpection Source Electron induced Display (Tungsten Hair Pin Type) Probe Current nA ~pA for SEM, Max. ~ 3uA Bean Control Beam Shift : ±125um, Beam Rotation: 360° SE Detector High Sensitivity SE detector Image Signal process 5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880) Work-Piece Positioning Tilted Holder 0°~60° (Max 90°) 5 Axis Stage Movement Stroke X/Y/Z/=-40/40/30mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R) Vacuum system Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge) Anti-Vibration Air-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site Control Rack PC Environmental Operation Operating system : Windows Serial communication: control data interface Display System 22” LCD monitor Port 3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation GUI& Tools BSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display Image Processor Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis) Automatic Control Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology)

Angstrom Advanced Hydrogen Generating Plant by Pressure Swing Adsorption with Purifying System

Angstrom Advanced Hydrogen Generating Plant by Pressure Swing Adsorption with Purifying System

For more information please call Angstrom Advanced at: 781.519.4765

Introduction

Angstrom Advanced Pressure Swing Adsorption (PSA) is used to separate hydrogen gas from other gases by feeding the gas under certain pressure. This separation process occurs in adsorption tower. The main advantages behind this technology is its low cost, low capacity, minimal maintenance requirements and a user-friendly interface. The H2 Purifying System removes oxygen from Hydrogen via a catalyst to get high purity H2 after adsorption of drying through the dust filter. The system can remove oxygen levels down to 1ppm. Through one step of purification, the purity can reach to 99.999~99.9999% and dew point can be lower than -70°C; Through a second purification step, O2 can be lowered down to less than 0.1ppm and dew point can be lowered to -90°C.

Specifications

H2 capacity 10-5000 Nm3/h

Dew Point ≤-60C

H2 purity % >98-99.999%

Work pressure 0.2-4.0MPa

PSA Process Overview

Pressure-Swing Adsorption or PSA is a technical process widely used these days in various Angstrom Advanced gas production applications. It’s a typically non-cryogenic way of purifying gas. PSA process differs from cryogenic techniques of gas separation as it can function under near-ambient temperatures. Under pressure, the PSA process separates some ‘species’ from a mixture, according to the molecular characteristics of those ‘species’. This is because different gases has the propensity to be attracted to different solid surfaces more or less strongly.More gas is adsorbed at higher pressure while the gas is desorbed as the pressure is reduced. Suppose air under pressure is passed through a vessel containing an adsorbent bed and this bed has the property to attract nitrogen more strongly than oxygen. What will happen is that a part or all of the nitrogen will remain in the bed, while the gas coming out of the vessel will be enriched in oxygen. As the bed reaches its optimum capacity to adsorb nitrogen, it can again be regenerated by reducing the pressure. Releasing the adsorbed nitrogen in the process. Thus readying itself for another cycle of oxygen enriched air. This cycle goes on. Popular adsorptive materials like carbon, zeolites, silica etc. are used as the adsorbent beds. They selectively adsorb the undesired gases at high pressure on their surface. Continuous production of the target gas is achieved by using more than one adsorbent chamber. However it is not a very easy process and difficult to model accurately. But once properly modeled, adsorption process can result in complex diffusion relationships.

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