Aotomic Force Microscope & Scanning Probe Microscope Software

The Software is available with the following data types of images AFM Contact Mode: Topography — the rise and fall of the sample surface. Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can be reflected by the Photodectetor’s Up-Down signal. Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal. AFM Tapping Mode: Topography — he rise and fall of the sample surface. Amplitude — antilever oscillating amplitude changes because of the rise and fall of sample topography. Phase — cantilever oscillating phase changes because of the sample material characteristics. Scanning Tunneling Microscope: Topography — the rise and fall of the sample surface. Current — Tunneling current changes between tip and sample surface.