Angstrom Advanced Scanning Probe Microscopy (SPM)

       Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981. Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode. The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. They owe this largely to the ability of piezoelectric actuators to execute motions with a precision and accuracy at the atomic level or better on electronic command. One could rightly call this family of techniques “piezoelectric techniques”. The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.


                                                                       AA3000 Scanning Probe Microscope

Introduction
AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance

• Atomic-scale of resolution
• Large sample size
• DSP (Digital Signal Processor)- for great performance
• Real time operating system embedded
• Fast Ethernet connection with computer

Multi-Function

• Atomic Force Microscope (AFM)
• Scanning Tunneling Microscope (STM)
• Lateral Force Microscope (LFM)
• Force Analysis: I-V Curve, I-Z Curve, Force Curve
• Online real-time 3D image for better observation
• Multi-channel signals for more sample details
• Trace-Retrace scan, Back-Forward scan
• Multi-Analysis: Granularity and Roughness
• Data load-out for further analysis

Easy Operation

• Fast automatically tip-engaging
• Simple change of the tip holder to switch between STM and AFM
• Full digital control, auto system status recognition
• Software-based sample movement
• Nano-Movie function: Continuous data collection, storage and replay
• Modularized design for convenient maintenance and future upgrades

For more information http://www.angstrom-advanced.com/?page=Y3000